Tip Characterization Devices

AFM Tip Characterization Devices
by Aurora Nanodevices

TipCheck AFM tip imaging device
Identify broken AFM tips Determine morphology of tip shaft
TipCheck exploits reverse imaging to provide a fast and simple way to assess new and used tips without the need for SEM inspection. TipCheck helps you to categorize your tips and permits qualitative comparisons between tips. More information on TipCheck Buy online at the Nanoscience webstore Price: Inquire about discounts when purchasing in combination with SPIP software and its Tip Characterization module.
Nioprobe AFM tip imaging device
Sharp peaks of less than 5nm radius Hard sample material resistant to wear of contact mode imaging Determine the shape of your AFM tip apex
The Nioprobe's randomly oriented sharp peaks makes this sample very suitable for reverse imaging of the AFM tip apex. The sharpness - 5 nm - is perfect for characterizing the tip for medium to small scale AFM imaging. More information on Nioprobe Buy online at the Nanoscience webstore Price: Inquire about discounts when purchasing in combination with SPIP software and its Tip Characterization module.

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