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KFM & Conductive Tapping Mode AFM Probes

Nanoscience Products: AFM Probes > KFM & Conductive Tapping Mode AFM Probes
KFM & Conducting Tapping Mode AFM Probes
KFM / KPFM (Kelvin Probe Force Microscopy) and conductive tapping mode probes are offered with Pt and Pt/Ir coatings, or an Ag2Ga cylindrical needle, for conductive AFM measurements.

Browse these categories under "KFM & Conductive Tapping Mode AFM Probes"

Team Nanotec Conductive Tapping Mode Probes

Team Nanotec Conductive Tapping Mode Probes

Team Nanotec high resolution conductive tapping mode AFM probes.
Pt coating; Length: 125 µm; Spring Constant: 40 N/m; Res. freq: 300 kHz

Featured products under "KFM & Conductive Tapping Mode AFM Probes"
Show product details for AppNano Conductive Tapping Mode AFM Probes

AppNano Conductive Tapping Mode AFM Probes

Electrostatic force mode AFM probes with Pt/Ir coating, 40 N/m spring constant, and 300 KHz resonance.

Show product details for AppNano Conductive Tapping Mode AFM Probes
Show product details for Metallic needle AFM probe for KFM & conductive tapping mode - short cantilever

Metallic needle AFM probe for KFM & conductive tapping mode - short cantilever

NaugaNeedles 300 kHz tapping mode AFM probes with Ag2Ga cylindrical needle. Cantilever length: 125 µm, Spring Constant: 40 N/m, Needle length: 1 to 100 µm.

Show product details for Metallic needle AFM probe for KFM & conductive tapping mode - short cantilever
Show product details for Metallic needle AFM probe for KFM & conductive tapping tode - long cantilever

Metallic needle AFM probe for KFM & conductive tapping tode - long cantilever

NaugaNeedles 190 kHz tapping mode AFM probes with Ag2Ga cylindrical needle. Cantilever length: 225 µm, Spring Constant: 48 N/m, Needle length: 1 to 100 µm.

Show product details for Metallic needle AFM probe for KFM & conductive tapping tode - long cantilever

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