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High Aspect Ratio - Pyramidal Silicon Tips

Nanoscience Products: AFM Probes > High Aspect Ratio - Pyramidal Silicon Tips
Standard Silicon High Aspect Ratio AFM Tips
High Aspect Ratio AFM probes with pyramidal silicon tips are designed for deep trench measurements and samples with steep sidewalls. Models are available without tilt compensation and there are also several models with angled tips for different AFM mounting designs. Various spike lengths are also available.
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High Aspect Ratio - Pyramidal Silicon Tips

Applied Nanostructures High Aspect Ratio Tapping mode probes - 0°,3°, or 12° tilt. Cantilever Length: 125, Spring Constant: 40 N/m, Resonant freq: 300 kHz

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Nano Manipulation and Sensing Devices
Nano Manipulation
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Science at the Nanoscale: An Introductory Textbook
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