NaDiaProbes All-Diamond Conductive Contact Probes

NaDiaProbes^® are the only available AFM probes constructed entirely of diamond. They differ greatly from diamond-coated silicon or silicon nitride probes in that both the cantilever and tip are 100 percent UNCD^®, a thin-film form of nanocrystalline diamond manufactured exclusively by Advanced Diamond Technologies.

Conductive NaDiaProbes also feature an all-diamond tip and cantilever, but are manufactured entirely from electrically conductive UNCD^® with a resitivity of less than 1 ohm*cm. So, don't let the delamination of conductive metal coatings frustrate you any longer. These NaDiaProbes are conductive inside and out!

NaDiaProbes benefit from the unsurpassed hardness of diamond and outlast standard silicon probes by more than 100 times when imaging hard surfaces - without sacrificing tip sharpness. NaDiaProbes also provide enhanced imaging performance on soft, sticky samples because of the low adhesion and low surface energy of diamond. They are suited for a wide variety of standard imaging applications as well as for applications in nanoscale metrology, inspection, and manufacturing.

An aluminum coating is applied to the back side of the cantilever. The coating is for improved laser reflectivity and does not cover the tip side. An industry-standard chip design ensures compatibility with commercial AFMs.

NaDiaProbes are also available for non-conductive contact mode imaging and tapping/dynamic mode imaging.