NaDiaProbes All-Diamond Tapping Mode AFM Probes

Nanoscience Products: AFM Probes > All-diamond AFM Probes > NaDiaProbes All-Diamond Tapping Mode AFM Probes

Tapping mode - 2 cantilever lengths - all-diamond tip and lever

NaDiaProbes^® are the only available AFM probes constructed entirely of diamond. They differ greatly from diamond-coated silicon or silicon nitride probes in that both the cantilever and tip are 100 percent UNCD^®, a thin-film form of nanocrystalline diamond manufactured exclusively by Advanced Diamond Technologies.

NaDiaProbes benefit from the unsurpassed hardness of diamond and outlast standard silicon probes by more than 100 times when imaging hard surfaces - without sacrificing tip sharpness. NaDiaProbes also provide enhanced imaging performance on soft, sticky samples because of the low adhesion and low surface energy of diamond. They are suited for a wide variety of standard imaging applications as well as for applications in nanoscale metrology, inspection, and manufacturing.

NaDiaProbes have an aluminum coating on the back side of the cantilever. The coating is for improved laser reflectivity and does not cover the tip side. An industry-standard chip design ensures compatibility with commercial AFMs.

These unique all-diamond probes are also available for contact mode imaging and conductive contact mode imaging.

Features:

Extreme hardness and strength
Extremely high modulus and low dissipation
Extremely wear resistant
Low film stress
Chemically inert and stable - Resists build-up of debris
Low friction - Prevents damage to sample

Data Sheet:

All-diamond AFM Probes

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Qty	Part #	Description	Price
	ND-DYIRS-4	All-Diamond Tapping Mode AFM Probes with Short Cantilever - 4 pack Currently Unavailable. Contact us for details or substitution recommendations.	$249.00
	ND-DYIRL-4	All-Diamond Tapping Mode AFM Probes with Long Cantilever - 4 pack Currently Unavailable. Contact us for details or substitution recommendations.	$249.00