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High Resolution Solid Carbon Cone- 3 nm tip radius

Nanoscience Products: AFM Probes > High Resolution Solid Carbon Cone- 3 nm tip radius
High Resolution Solid Carbon Cone
High Resolution Solid Carbon Cone AFM probes are designed for tapping, contact, and force modulation mode applications. These probes feature a high resolution solid carbon cone shaped tip (3 nm radius) manufactured by EBID on silicon pedestal and silicon cantilevers. These tips combine high resolution with the ability to scan high aspect ratio structures.
Show product details for Solid Carbon Cone Tapping Mode Probes (3 nm tip radius) HRSCC

Solid Carbon Cone Tapping Mode Probes (3 nm tip radius) HRSCC

Team Nanotec High Resolution Solid Carbon Cone Tapping mode AFM probes. Length: 125 µm, Spring Constant: 40 N/m , Resonant freq: 300 kHz, Tip Radius: 3 nm

Show product details for Solid Carbon Cone Tapping Mode Probes (3 nm tip radius) HRSCC

Show product details for Solid Carbon Cone Force Modulation Probes (3 nm tip radius) HRSCC

Solid Carbon Cone Force Modulation Probes (3 nm tip radius) HRSCC

Team Nanotec High Resolution Solid Carbon Cone Force Modulation mode AFM probes. Length: 225 µm, Spring Constant: 3.0 N/m , Resonant freq: 75 kHz, Tip Radius: 3 nm

Show product details for Solid Carbon Cone Force Modulation Probes (3 nm tip radius) HRSCC
Show product details for Solid Carbon Cone Contact Mode Probes (3 nm tip radius) HRSCC

Solid Carbon Cone Contact Mode Probes (3 nm tip radius) HRSCC

Team Nanotec High Resolution Solid Carbon Cone Contact mode AFM probes. Length: 450 µm, Spring Constant: 0.2 N/m , Resonant freq: 15 kHz, Tip Radius: 3 nm

Show product details for Solid Carbon Cone Contact Mode Probes (3 nm tip radius) HRSCC

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