All AFM Probes & SPM Supplies
Powerful image processing software for your AFM or STM system: SPIP - the Scanning Probe Image Processor
40% off full configurations!
Solid Carbon Cone Tapping Mode Probes (3 nm tip radius) HRSCC
Team Nanotec High Resolution Solid Carbon Cone Tapping mode AFM probes. Length: 125 µm, Spring Constant: 40 N/m , Resonant freq: 300 kHz, Tip Radius: 3 nm
Solid Carbon Cone Force Modulation Probes (3 nm tip radius) HRSCC
Team Nanotec High Resolution Solid Carbon Cone Force Modulation mode AFM probes. Length: 225 µm, Spring Constant: 3.0 N/m , Resonant freq: 75 kHz, Tip Radius: 3 nm
Solid Carbon Cone Contact Mode Probes (3 nm tip radius) HRSCC
Team Nanotec High Resolution Solid Carbon Cone Contact mode AFM probes. Length: 450 µm, Spring Constant: 0.2 N/m , Resonant freq: 15 kHz, Tip Radius: 3 nm
Nano Manipulation and Sensing Devices
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We have a large number of probes & accessories that are suited for a wide variety of research. Deciding which is best can be difficult. Call us to discuss your application. Each of our technical sales staff has over a decade of experience in AFM.