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All AFM Probes

Standard AFM Probes

Dynamic & Tapping
Contact mode
Force Modulation mode
Fluid & Bio imaging

Wear Resistant Probes

All-Diamond
Nanotube AFM tips
Metal Carbide coated

Conductive AFM Probes

Electrostatic Force (EFM)
SSR & Conductive contact
KFM & Conductive tapping
Metal Carbide coated
Solid Diamond Conductive
Metallic Needle probes

Magnetic AFM Probes

Standard MFM
High Aspect MFM

High Aspect AFM Probes

Standard Silicon High Aspect
Conical Silicon High Aspect
Critical Dimension AFM tips
Metal Needle AFM tips
Nanotube AFM tips

High Resolution Probes

Pyramidal Silicon Super Sharp
Conical Silicon Super Sharp
Carbon Super Sharp

Hemispherical &
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Metal Coated
250 to 750 nm Tip Radius
Nanoindentation

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Biological & Fluid Probes

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Thiol Chemicals

Manipulation
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new

Controllers

Characterization
& Standards

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Pyramidal Silicon Super Sharp Probes

Nanoscience Products: AFM Probes > Super Sharp Tips > Pyramidal Silicon Super Sharp Probes

Show product details for ACL-SS Super Sharp Dynamic Mode AFM Probes

ACL-SS Super Sharp Dynamic Mode AFM Probes

Applied Nanostructures AC/tapping mode Long cantilever Super Sharp AFM probes. Length: 225 µm, Spring Constant: 45 N/m, Resonant freq: 190 kHz, Tip radius: 2 nm

Show product details for ACT-SS Super Sharp Dynamic Mode AFM Probes

ACT-SS Super Sharp Dynamic Mode AFM Probes

Applied Nanostructures AC/Tapping mode Super Sharp AFM probes. Length: 125 µm, Spring Constant: 40 N/m, Resonant freq: 300 kHz, Tip radius: 2 nm

Show product details for FORT-SS Super Sharp Force Modulation AFM probes

FORT-SS Super Sharp Force Modulation AFM probes

Applied Nanostructures FORce Modulation / Tapping mode Super Sharp AFM probes. Length: 225 µm, Spring Constant: 3.0 N/m, Resonant freq: 62 kHz, Tip Radius: 2 nm

Show product details for SHOCON-SS Super Sharp Contact Mode AFM probes

SHOCON-SS Super Sharp Contact Mode AFM probes

Applied Nanostructures SHOrt CONtact mode Super Sharp AFM probes. Length: 225 µm, Spring Constant: 0.10 N/m, Resonant freq: 28 kHz, Tip Radius: 2 nm

Show product details for SICON-SS Super Sharp Contact Mode AFM probes

SICON-SS Super Sharp Contact Mode AFM probes

Applied Nanostructures Silicon CONtact mode Super Sharp AFM probes. Length: 450 µm, Spring Constant: 0.2 N/m, Resonant freq: 12 kHz , Tip Radius: 2 nm

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