High Aspect Ratio AFM probes with conical silicon tips are designed for deep trench measurements and samples with steep sidewalls. Models are available without tilt compensation and there are also several models with angled tips for different AFM mounting designs.
Browse these categories under "High Aspect Ratio - Conical Silicon Tips"
We have a large number of probes & accessories that are suited for a
wide variety of research. Deciding which is best can be difficult. Call us to discuss your application.
Each of our technical sales staff has over a decade of experience in AFM.