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Contact Mode AFM Probes

Contact Mode
Low spring constant AFM probes that are used by a wide variety of AFMs for contact mode imaging.
Show product details for AppNano SICON Contact Mode AFM Probes

AppNano SICON Contact Mode AFM Probes

Applied Nanostructures Silicon CONtact mode AFM probes. Length: 450 µm, Spring Constant: 0.2 N/m , Resonant freq: 12 kHz

Show product details for Vistaprobes CL Contact Mode AFM Probes

Vistaprobes CL Contact Mode AFM Probes

Vistaprobes Contact mode Long cantilever silicon AFM probes.
Length: 450 µm, Spring Constant: 0.2 N/m , Resonant freq: 12 kHz

Show product details for AppNano SHOCON Contact or (Fluid Tapping) AFM Probes

AppNano SHOCON Contact or (Fluid Tapping) AFM Probes

Applied Nanostructures SHOrt CONtact mode silicon AFM probes. Length: 225 µm, Spring Constant: 0.1 N/m , Resonant freq: 28 kHz

Show product details for Vistaprobes CS Contact or (Fluid Tapping) AFM Probes

Vistaprobes CS Contact or (Fluid Tapping) AFM Probes

Vistaprobes Contact mode Short cantilever silicon AFM probes.
Length: 225 µm, Spring Constant: 0.1 N/m , Resonant freq: 28 kHz

Nano Manipulation and Sensing Devices
Nano Manipulation
and Sensing Devices


Science at the Nanoscale: An Introductory Textbook
Nanoscience and
Nanotechnology Books




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We have a large number of probes & accessories that are suited for a wide variety of research. Deciding which is best can be difficult. Call us to discuss your application. Each of our technical sales staff has over a decade of experience in AFM.

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