All AFM Probes & SPM Supplies
Powerful image processing software for your AFM or STM system: SPIP - the Scanning Probe Image Processor
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AppNano SICON Contact Mode AFM Probes
Applied Nanostructures Silicon CONtact mode AFM probes. Length: 450 µm, Spring Constant: 0.2 N/m , Resonant freq: 12 kHz
Vistaprobes CL Contact Mode AFM Probes
Vistaprobes Contact mode Long cantilever silicon AFM probes. Length: 450 µm, Spring Constant: 0.2 N/m , Resonant freq: 12 kHz
AppNano SHOCON Contact or (Fluid Tapping) AFM Probes
Applied Nanostructures SHOrt CONtact mode silicon AFM probes. Length: 225 µm, Spring Constant: 0.1 N/m , Resonant freq: 28 kHz
Vistaprobes CS Contact or (Fluid Tapping) AFM Probes
Vistaprobes Contact mode Short cantilever silicon AFM probes. Length: 225 µm, Spring Constant: 0.1 N/m , Resonant freq: 28 kHz
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We have a large number of probes & accessories that are suited for a wide variety of research. Deciding which is best can be difficult. Call us to discuss your application. Each of our technical sales staff has over a decade of experience in AFM.