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MFM Probes - Pyramidal Silicon

Magnetic Force Mode
Designed for magnetic force microscopy, these probes yield a very high force sensitivity and feature a magnetic coating (available in various thicknesses) covering the cantilever and tip.
Show product details for AppNano MAGT Magnetic force mode AFM probes

AppNano MAGT Magnetic force mode AFM probes

Magnetic force mode AFM probes with low, medium, or high moment. Cantilever Length: 225 µm, Spring Constant: 3 N/m , and Resonant freq: 62 kHz.

Nano Manipulation and Sensing Devices
Nano Manipulation
and Sensing Devices


Science at the Nanoscale: An Introductory Textbook
Nanoscience and
Nanotechnology Books




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