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Electrostatic Force (EFM) Probes

EFM Probes for Atomic Force Microscopy
EFM probes are offered with Pt and Pt/Ir coatings, or an Ag2Ga cylindrical needle, and are suitable for electrostatic force measurements (typically done with a force-modulation type cantilever) and other conductive tapping mode AFM applications.

Browse these categories under "Electrostatic Force (EFM) Probes"

Team Nanotec Eletrostatic Force Mode AFM Probes

Team Nanotec Eletrostatic Force Mode AFM Probes

Team Nanotec high resolution EFM probes with Pt coating.
Length: 225 µm; Spring Constant: 3 N/m; Res. freq: 75 kHz


Featured products under "Electrostatic Force (EFM) Probes"

Show product details for AppNano EFM Conductive AFM Probes

AppNano EFM Conductive AFM Probes

Electrostatic force mode AFM probes with Pt/Ir coating, 3.0 N/m spring constant, and 62 KHz resonance.

Show product details for AppNano Access Electrostatic Force Mode AFM Probes

AppNano Access Electrostatic Force Mode AFM Probes

Applied Nanostructures EFM/Electric Force Mode AFM probes with exposed tip. Length: 245 µm, Spring Constant: 3.8 N/m , Resonant freq: 52 kHz

Show product details for Metallic needle AFM probe for Electrostatic Force Mode (EFM)

Metallic needle AFM probe for Electrostatic Force Mode (EFM)

NaugaNeedles 62 kHz tapping mode AFM probes with Ag2Ga cylindrical needle. Cantilever length: 225 µm, Spring Constant: 3 N/m, Needle length: 1 to 100 µm.

Nano Manipulation and Sensing Devices
Nano Manipulation
and Sensing Devices


Science at the Nanoscale: An Introductory Textbook
Nanoscience and
Nanotechnology Books




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We have a large number of probes & accessories that are suited for a wide variety of research. Deciding which is best can be difficult. Call us to discuss your application. Each of our technical sales staff has over a decade of experience in AFM.

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