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SS-ISC Super Sharp Improved Super Cone Tapping Mode Probes
Nanoscience Products: AFM Probes > Super Sharp Tips
Part #:
Team Nanotec Tapping Mode Super Sharp Improved Super Cone AFM probes. Length: 125 µm, Spring Constant: 40 N/m, Resonance freq: 300 kHz, Tip radius: < 5 nm More details...
Cantilever Length (µm): 125
Res. Frequency (kHz): 300
Spring Constant (N/m): 40
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SS-ISC Super Sharp Improved Super Cone Tapping Mode Probes

 
Product Details

Samples packs are available at reduced prices.
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Ordering Information
Qty Coating Part Number Price Buy Now
5
probes
 Al reflex SS-ISC-125C40-R-5 $545.00 Add to Cart
10
probes

Al reflex

SS-ISC-125C40-R-10 $990.00 Add to Cart
50
probes
 Al reflex SS-ISC-125C40-R-50 $3990.00 Add to Cart


Team Nanotec SS-ISC AFM probes feature a super sharp tip for surface roughness measurements in tapping mode.

The backside of the SS-ISC cantilever is treated with an Al reflex coating to enhance the reflectivity of the laser beam and prevent light from interfering with the cantilever.

SS-ISC AFM probes can also be ordered for force modulation applications SS-ISC-225C3.0-R.


Technical Data
Typical Value
Force Constant
40 N/m
Resonance Frequency
300 kHz
Cantilever Length
125 µm
Number of Cantilevers
1 per chip
Tip Height
> 9 µm
Tip Style
Super Sharp Improved Super Cone
Tip Radius
< 5 nm
Full Cone Angle
< 5° for < 150 nm
Reflex Coating
Aluminum (non-tip side)

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