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SS-ISC Super Sharp Improved Super Cone Force Modulation Probes
Nanoscience Products: AFM Probes > Super Sharp Tips
Part #:
Team Nanotec Force Modulation Super Sharp Improved Super Cone AFM probes. Length: 225 µm, Spring Constant: 3.0 N/m, Resonance freq: 75 kHz, Tip radius: < 5 nm More details...
Cantilever Length (µm): 225
Res. Frequency (kHz): 75
Spring Constant (N/m): 3.0
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SS-ISC Super Sharp Improved Super Cone Force Modulation Probes

 
Product Details
Ordering Information
Qty
Coating
 Part Number Price Buy Now
5
probes
Al reflex
 SS-ISC-225C3.0-R-5 $545.00 Add to Cart
10
probes
Al reflex
 SS-ISC-225C3.0-R-10 $990.00 Add to Cart
50
probes
Al reflex
 SS-ISC-225C3.0-R-50 $3990.00 Add to Cart


Team Nanotec SS-ISC AFM probes feature a super sharp tip for surface roughness measurements in force modulation.

The backside of the SS-ISC cantilever is treated with an Al reflex coating to enhance the reflectivity of the laser beam and prevent light from interfering with the cantilever.

SS-ISC AFM probes can also be ordered for tapping mode applications SS-ISC-125C40-R.

Technical Data
Typical Value
Force Constant
3.0 N/m
Resonance Freq.
75 kHz
Cantilever Length
225 µm
Number of Cantilevers
1 per chip
Tip Height
> 9 µm
Tip Style
Super Sharp Improved Super Cone
Tip Radius
< 5 nm
Full Cone Angle
< 5° for < 150 nm
Reflex Coating
Aluminum (non-tip side)

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