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Aspire CT300 Conical Tapping Mode AFM Probes

Part #:
Aspire Conical Tapping mode silicon AFM probes.
Length: 125 m, Spring Constant: 40 N/m, Resonant freq: 300 kHz More details...
Cantilever Length (m): 125
Res. Frequency (kHz): 300
Spring Constant (N/m): 40
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Aspire CT300 Conical Tapping Mode AFM Probes
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Aspire CT300 Conical Tapping Mode AFM Probes

Aspire CT300 Conical Tapping Mode AFM Probes
Aspire CT300 Conical Tapping Mode AFM Probes
Aspire CT300 Conical Tapping Mode AFM Probes
Aspire CT300 Conical Tapping Mode AFM Probes
Aspire CT300 Conical Tapping Mode AFM Probes
Aspire CT300 Conical Tapping Mode AFM Probes
Aspire CT300 Conical Tapping Mode AFM Probes
Aspire CT300 Conical Tapping Mode AFM Probes
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Product Details

Aspire AFM Probe Product FlyerAspire Conical AFM Tips

Ordering Information

Quantity

Coating

Part Number

Price

Buy Now
10
probes
None CT300-10
$250.00
Add to Cart
Al reflex CT300R-10 Add to Cart
25
probes
None CT300-25
$550.00
Add to Cart
Al reflex CT300R-25 Add to Cart
50
probes1
None CT300-25 (x2)
$990.00
Add to Cart
Al reflex CT300R-25 (x2) Add to Cart
75
probes1
None CT300-25 (x3)
$1,380.00
Add to Cart
Al reflex CT300R-25 (x3) Add to Cart
100
probes1
None CT300-25 (x4)
$1,720.00
Add to Cart
Al reflex CT300R-25 (x4) Add to Cart
200
probes2
None CT300-200
$2,999.00
Add to Cart
Al reflex CT300R-200 Add to Cart
400
probes2
(wafer qty)
None CT300-400
$4,999.00
Add to Cart
Al reflex CT300R-400 Add to Cart


Aspire - Experience the Conical Advantage
The geometry of an AFM tip plays an important role when imaging surfaces. The use of a uniform, conical tip guarantees that youre acquiring truly symmetrical images. A conical shape is especially beneficial when imaging membranes (holes) and pillar structures, or random structures with surface roughness. Aspire AFM probes are the first conically-shaped AFM tips for the mass-market. Manufactured from high-quality, highly doped, single crystal silicon, these probes are robust and offer long imaging life.

Aspire probe model CT300 is designed for general tapping mode applications and features a typical tip radius of 8 nm. (A sharper, higher-aspect conical tip is available on Team Nanotec's SS-ISC probe.)


An industry-standard chip design guarantees compatibility with all standard AFM chip holders and also the pre-aligned holders on Nanosurf AFMs*. Model CT300R probes have an aluminum Reflex coating* on the cantilever's detector side. The coating improves laser reflection and does not coat the cantilever's tip.

1Quantity Discounts / Volume Pricing on AFM tips, probes, and cantilevers Quantity Discounts / Volume Prices are applied when multiple 25-packs are ordered. Buy two Aspire 25-packs and save $55.00 on each. Purchase three 25-packs and save $90.00 on each. When ordering 4 or more 25-packs, you'll save $120.00 on each pack! Quantity Discounts are reflected in the prices shown above.

2Please contact us about packaging options for half wafers (200 probes) and full wafers (400 probes).



Technical Data Typical Value Range
Force Constant 40 N/m 20 - 95 N/m
Resonance Frequency 300 kHz 208 - 392 kHz
Length 125 m 115 - 135 m
Width 42 m 40 - 45 m
Thickness 3.5 m 2.5 - 4.5 m
Shape / Cross-section Rectangular / Rectangular
Number of Cantilevers 1 per chip
Tip Offset ~ 10 m
Tip Style Conical
Tip Aspect Ratio 1.5:1
Tip Cone Angle 30 degrees
Tip Height 15 m 12.5 - 17.5 m
Tip Radius ~ 8 nm < 10 nm
Material Single Crystal Silicon, n-type, highly doped
Chip Size
(industry standard)
3400 m (L) x 1600 m (W) x 315 m (T)
Alignment Grooves Yes
Coating (optional)* Aluminum reflex (on non-tip side)

*Reflex coating is required for some Nanosurf Atomic Force Microscopes.
Please contact us for details.

 



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