AFM Calibration Grids

As low as $149.00
In stock
SKU
3 -(select options)

Silicon XYZ grating with 4 µm OR 10 µm period and 25 nm step height.

Ordering Information

Quantity

Pitch

Part Number

Price
1 
grid
µm 32400
$149.00
1 
grid
10 µm 32100
$149.00
2 grids
(1 of each)
µm and 10 µm 33000
$229.00


Our 32400 and 32100 calibration standards offer outstanding quality at a very low price and permit calibration of an AFM scanner in all three dimensions. These etched silicon XYZ gratings are easy to use - no alignment or positioning is necessary - because the calibration area covers the entire 5 mm x 5 mm sample area. They feature a chessboard-like structure consisting of either a 2 µm square pattern with a 4 µm period (32400) or a 5 µm square pattern with a 10 µm period (32100). The structure step height is in the range of 25 nm. The grating is glued to a 10mm diameter steel disc with conductive epoxy. 

Technical data: 

Die size:
 5 x 5 mm 

Surface geometry: Square silicon mesas with either a 4 µm or 10 µm pitch, arranged over the entire surface area. 

Step height:
 ~ 25 nm 

More Information
Allow Set Quantities Yes
Featured Yes
Specs

Silicon XYZ grating with 4 µm OR 10 µm period and 25 nm step height.

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