Aspire CT130

As low as $250.00
In stock
SKU
CT130 -(select options)

Conical Tapping Mode AFM Probe

Ordering Information

Quantity

Coating

Part Number

Price
10 
probes
None CT130-10
$250.00*
Al reflex CT130R-10
25 
probes
None CT130-25
$550.00*
Al reflex CT130R-25
50 
probes
None CT130-50
$990.00*
Al reflex CT130R-50
75 
probes
None CT130-75
$1,380.00*
Al reflex CT130R-75
100 
probes
None CT130-100
$1,720.00*
Al reflex CT130R-100

*A 10% discount is offered to academic and government institutions. To receive the discount, enter academic10 as the Discount Code during checkout. This discount may not be combined with most other sales, promotions, discounts, codes, coupons and/or offers.


Aspire - Experience the Conical Advantage

The geometry of an AFM tip plays an important role when imaging surfaces. The use of a uniform, conical tip guarantees that you’re acquiring truly symmetrical images. A conical shape is especially beneficial when imaging membranes (holes) and pillar structures, or random structures with surface roughness. Aspire™ AFM probes are the first conically-shaped AFM tips for the mass-market. Manufactured from high-quality, highly doped, single crystal silicon, these probes are robust and offer long imaging life.

Aspire probe model CT130 is designed for tapping mode applications and features a softer spring constant (6 N/m) while maintaining a mid-range resonance frequency (130 kHz). Typical tip radius is 8 nm. An industry-standard chip design guarantees compatibility with all standard AFM chip holders and also the pre-aligned holders on Nanosurf AFMs*. Model CT130R probes have an aluminum Reflex coating* on the cantilever's detector side. The coating improves laser reflection and does not coat the cantilever's tip.

2Please contact us about packaging options for half wafers (200 probes) and full wafers (400 probes).
Technical Data Typical Value Range
Force Constant 6 N/m 2 - 10 N/m
Resonance Frequency 130 kHz 75 - 190 kHz
Length 125 µm 115 - 135 µm
Width 42 µm 40 - 45 µm
Thickness 1.7 µm 1.0 - 3.0 µm
Shape / Cross-section Rectangular / Rectangular
Number of Cantilevers 1 per chip
Tip Offset ~ 10 µm
Tip Style Conical
Tip Aspect Ratio 1.5:1
Tip Cone Angle 30 degrees
Tip Height 15 µm 12.5 - 17.5 µm
Tip Radius ~ 8 nm < 10 nm
Material Single Crystal Silicon, n-type, highly doped
Chip Size
(industry standard)
3400 µm (L) x 1600 µm (W) x 315 µm (T)
Alignment Grooves Yes
Coating (optional)* Aluminum reflex (on non-tip side)
More Information
Spring Constant (Nominal) 6 N/m
Spring Constant $6.00
Frequency (Nominal) 130 kHz
Frequency $130.00
Allow Set Quantities Nope
Featured Yes
Specs

Conical Tapping Mode AFM Probe

© 2018 Nanoscience Instruments