Aspire CT300

As low as $250.00
In stock
CT300 -(select options)

Conical Tapping Mode AFM Probe

Ordering Information



Part Number

None CT300-10
Al reflex CT300R-10
None CT300-25
Al reflex CT300R-25
None CT300-50
Al reflex CT300R-50
None CT300-75
Al reflex CT300R-75
None CT300-100
Al reflex CT300R-100

*A 10% discount is offered to academic and government institutions. To receive the discount, enter academic10 as the Discount Code during checkout. This discount may not be combined with most other sales, promotions, discounts, codes, coupons and/or offers.

Aspire - Experience the Conical Advantage

The geometry of an AFM tip plays an important role when imaging surfaces. The use of a uniform, conical tip guarantees that you’re acquiring truly symmetrical images. A conical shape is especially beneficial when imaging membranes (holes) and pillar structures, or random structures with surface roughness. Aspire™ AFM probes are the first conically-shaped AFM tips for the mass-market. Manufactured from high-quality, highly doped, single crystal silicon, these probes are robust and offer long imaging life. 

Aspire probe model CT300 is designed for general tapping mode applications and features a typical tip radius of 8 nm. (A sharper, higher-aspect conical tip is available on Team Nanotec's SS-ISC probe.) An industry-standard chip design guarantees compatibility with all standard AFM chip holders and also the pre-aligned holders on Nanosurf AFMs*. Model CT300R probes have an aluminum Reflex coating* on the cantilever's detector side. The coating improves laser reflection and does not coat the cantilever's tip. 

Please contact us about packaging options for half wafers (200 probes) and full wafers (400 probes).

Technical Data Typical Value Range
Force Constant 40 N/m 20 - 95 N/m
Resonance Frequency 300 kHz 208 - 392 kHz
Length 125 µm 115 - 135 µm
Width 42 µm 40 - 45 µm
Thickness 3.5 µm 2.5 - 4.5 µm
Shape / Cross-section Rectangular / Rectangular
Number of Cantilevers 1 per chip
Tip Offset ~ 10 µm
Tip Style Conical
Tip Aspect Ratio 1.5:1
Tip Cone Angle 30 degrees
Tip Height 15 µm 12.5 - 17.5 µm
Tip Radius ~ 8 nm < 10 nm
Material Single Crystal Silicon, n-type, highly doped
Chip Size
(industry standard)
3400 µm (L) x 1600 µm (W) x 315 µm (T)
Alignment Grooves Yes
Coating (optional)* Aluminum reflex (on non-tip side)
More Information
Spring Constant (Nominal) 40 N/m
Spring Constant $40.00
Frequency (Nominal) 300 kHz
Frequency $300.00
Allow Set Quantities Nope
Featured No

Conical Tapping Mode AFM Probe

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