Characterization & Standards

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  1. AFM Calibration Grids
    AFM Calibration Grids
    As low as $149.00

    Silicon XYZ grating with 4 µm OR 10 µm period and 25 nm step height.

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  2. TipCheck AFM tip imaging device
    TipCheck AFM tip imaging device
    $179.00

    Tip imaging device for evaluation of general tip morphology.

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