Nanosensors Akiyama-Probe

As low as $660.00
In stock
SKU
A-PROBE -(select options)

Novel self-sensing and self-actuating (-exciting) dynamic mode AFM probe

Akiyama-Probe is based on a quartz tuning fork combined with a micromachined cantilever. The great advantage of this novel probe is that one can benefit from both the tuning fork’s extremely stable oscillation and the silicon cantilever’s reasonable spring constant with one probe.

Akiyama-Probe is equipped with a special version of the NANOSENSORS™ AdvancedTEC, a high-end sharp silicon tip and has an excellent imaging capability on various samples with different properties, which is as high as that of a conventional optical lever system.

Akiyama-Probe requires neither optical detection, nor an external shaker. Akiyama-Probe occupies only a small volume above the sample. These features make it very attractive for creating a new generation of scanning probe microscopy (SPM) instruments.

More Information
Spring Constant (Nominal) 5 N/m
Spring Constant $5.00
Frequency (Nominal) 50 kHz
Frequency $50.00
Allow Set Quantities Yes
Featured Yes
Specs

Novel self-sensing and self-actuating (-exciting) dynamic mode AFM probe

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