Nanosensors AR10-NCH

As low as $1,334.00
In stock
AR10-NCH -(select options)

High-Aspect-Ratio, Tapping Mode AFM Probe

Ordering Information



Part Number

None AR10-NCH-10
Al reflex AR10-NCHR-10
None AR10-NCH-20
Al reflex AR10-NCHR-20
None AR10-NCH-50
Al reflex AR10-NCHR-50

NANOSENSORS™ AR10-NCH AFM tips are designed for non-contact or tapping mode AFM. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 10:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.

The probe offers unique features:

  • length of the high aspect ratio portion of the tip > 1.5 µm
  • typical aspect ratio at 1.5 µm in the order of 12:1 (when viewed from side as well as along cantilever axis)
  • half cone angle at 1.5 µm of the high aspect ratio portion typically < 2.8°
  • guaranteed tip radius of curvature < 15 nm
  • monolithic tip
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497

More Information
Spring Constant (Nominal) 42 N/m
Spring Constant $42.00
Frequency (Nominal) 330 kHz
Frequency $330.00
Allow Set Quantities Yes
Featured Yes

High-Aspect-Ratio, Tapping Mode AFM Probe

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