Nanosensors AR10T-NCH

As low as $2,002.00
In stock
AR10T-NCH -(select options)

High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe

Ordering Information



Part Number

None AR10T-NCH-10
Al reflex AR10T-NCHR-10
None AR10T-NCH-20
Al reflex AR10T-NCHR-20
None AR10T-NCH-50
Al reflex AR10T-NCHR-50

NANOSENSORS™ AR10T-NCH AFM tips are designed for non-contact mode or tapping mode AFM. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 10:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.

On the model AR10T the last 1.5 µm of the tip are tilted 13° to the center axis of the cantilever. With this feature the tilt angle of the cantilever caused by the mount of the AFM head (commonly 13°) will be compensated. Now, nearly vertical sidewalls can be measured offering a symmetrical scan.

The probe offers unique features:

  • length of the high aspect ratio portion of the tip > 1.5 µm
  • typical aspect ratio at 1.5 µm in the order of 12:1 (when viewed from side as well as along cantilever axis)
  • high aspect ratio portion of the tip tilted 13° to the cantilever surface normal
  • half cone angle at 1.5 µm of the high aspect ratio portion typically < 2.8°
  • guaranteed tip radius of curvature < 15 nm
  • monolithic tip
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 42 10 - 130
Resonance Frequency /kHz 330 204 - 497

More Information
Spring Constant (Nominal) 42 N/m
Spring Constant $42.00
Frequency (Nominal) 330 kHz
Frequency $330.00
Allow Set Quantities Yes
Featured Yes

High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe

© 2018 Nanoscience Instruments