Nanosensors ATEC-FM

As low as $445.00
In stock
SKU
ATEC -(select options)

Force Modulation AFM Probe with Real Tip Visibility

Ordering Information

Quantity

Coating

Part Number

Price
10 
probes
None ATEC-FM-10 $445.00
20 
probes
None ATEC-FM-20 $795.00
50 
probes
None ATEC-FM-50 $1,755.00
10 
probes
Pt/lr ATEC-EFM-10 $890.00
20 
probes
Pt/lr ATEC-EFM-20 $1,590.00
50 
probes
Pt/lr ATEC-EFM-50 $3,510.00
10 
probes
Au ATEC-FMAu-10 $890.00

NANOSENSORS AdvancedTEC™ FM AFM tips are designed for force modulation mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. This unique feature allows precise positioning and makes the AdvancedTEC™ the only AFM scanning probe in the world that offers REAL TIP VISIBILITY FROM TOP, even when the probe is tilted due to its mounting onto the AFM head. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation).

Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.

The probe offers unique features:

  • real tip visibility from top
  • typical tip radius of curvature better than 10 nm (better than 20nm in the ATEC-EFM)
  • tip height 15 - 20 µm
  • monolithic silicon
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 35 30 - 40
Length /µm 240 230 - 250
Force Constant /(N/m) 2.8 0.7 - 9
Resonance Frequency /kHz 85 50 - 130

More Information
Spring Constant (Nominal) 2.8 N/m
Spring Constant $2.80
Frequency (Nominal) 85 kHz
Frequency $85.00
Allow Set Quantities Yes
Featured Yes
Specs

Force Modulation AFM Probe with Real Tip Visibility

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