Nanosensors PL2-CONT

As low as $889.00
In stock
PL2-CONT -(select options)

Contact Mode AFM Probe with Plateau Tip

Ordering Information



Part Number

None PL2-CONT-10
Al reflex PL2-CONTR-10

The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.

NANOSENSORS™ PL2-CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request

The probe offers unique features:

  • plateau diameter of typically 1.8 µm
  • single crystalline silicon
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 2 1.0 - 3.0
Mean Width /µm 50 42 - 57
Length /µm 450 440 - 460
Force Constant /(N/m) 0.2 0.02 - 0.77
Resonance Frequency /kHz 13 6 - 21
Technical Data Tip Value
Plateau diameter (*) /µm 1.8 ± 0.5
Plateau rod height /µm > 2.0
Plateau edge radius /µm 0.2 - 0.4
Tip height (overall) /µm 10 - 15

More Information
Spring Constant (Nominal) 0.2 N/m
Spring Constant $0.20
Frequency (Nominal) 13 kHz
Frequency $13.00
Allow Set Quantities Yes
Featured Yes

Contact Mode AFM Probe with Plateau Tip

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