Nanosensors PL2-NCL

As low as $889.00
In stock
SKU
PL2-NCL -(select options)

Tapping Mode AFM Probe with Long Cantilever and Plateau Tip

Ordering Information

Quantity

Coating

Part Number

Price
10 
probes
None PL2-NCL-10
$889.00
Al reflex PL2-NCLR-10

The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.

NANOSENSORS™ PL2-NCL AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PL2-NCL is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request.

The probe offers unique features:

  • plateau diameter of typically 1.8 µm
  • single crystalline silicon
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 7 6.0 - 8.0
Mean Width /µm 38 30 - 45
Length /µm 225 215 - 235
Force Constant /(N/m) 48 21 - 98
Resonance Frequency /kHz 190 146 - 236
Technical Data Tip Value
Plateau diameter (*) /µm 1.8 ± 0.5
Plateau rod height /µm > 2
Plateau edge radius /µm 0.2 - 0.4
Tip height (overall) /µm 10 - 15
More Information
Spring Constant (Nominal) 48 N/m
Spring Constant $48.00
Frequency (Nominal) 190 kHz
Frequency $190.00
Allow Set Quantities Yes
Featured Yes
Specs

Tapping Mode AFM Probe with Long Cantilever and Plateau Tip

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