Nanosensors PPP-MFMR

$691.00
In stock
SKU
PPP-MFMR -(select options)

Force Modulation AFM Probe with Magnetic coating

Ordering Information

Quantity

Coating

Part Number

Price
10 
probes
Hard Magnetic (Medium Moment) PPP-MFMR-10
$691.00
Hard Magnetic (Low Moment) PPP-LM-MFMR-10
Soft Magnetic (Low Coercivity) PPP-LC-MFMR-10
20 
probes
Hard Magnetic (Medium Moment) PPP-MFMR-20
$1,237.00
Hard Magnetic (Low Moment) PPP-LM-MFMR-20
Soft Magnetic (Low Coercivity) PPP-LC-MFMR-20
50 
probes
Hard Magnetic (Medium Moment) PPP-MFMR-50
$2,728.00
Hard Magnetic (Low Moment) PPP-LM-MFMR-50
Soft Magnetic (Low Coercivity) PPP-LC-MFMR-50

The NANOSENSORS™ PPP-MFMR AFM probe is our standard probe for magnetic force microscopy providing a reasonable sensitivity, resolution and coercitivity. It has proven stable imaging of a variety of recording media and other samples. The force constant of this probe type is specially tailored for magnetic force microscopy yielding high force sensitivity while simultaneously enabling tapping mode and lift mode operation.

The hard magnetic coating on the tip is optimized for high magnetic contrast and high lateral resolution of considerably better than 50 nm. 

The SPM probe offers unique features:

  • hard magnetic coating on the tip side
    Ordering Information
    Configuration Coercivity of app. Remanence Magnetization of app.
    PPP-MFMR 300 Oe 300 emu/cm3
    PPP-LM-MFMR 250 Oe 150 emu/cm3
    PPP-LC-MFMR 0.75 Oe 225 emu/cm3
  • metallic electrical conductivity
  • guaranteed tip radius of curvature < 30 nm
  • magnetic resolution better than 30 nm in the PPP-LM-MFMR & PPP-LC-MFMR and 50 nm in the PPP-MFMR.
  • tip height 10 - 15 µm
  • Al coating on detector side of cantilever enhancing the reflectivity of the laser beam by a factor of about 2.5
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

As both coatings are almost stress free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115

More Information
Spring Constant (Nominal) 2.8 N/m
Spring Constant $2.80
Frequency (Nominal) 75 kHz
Frequency $75.00
Allow Set Quantities Yes
Specs

Force Modulation AFM Probe with Magnetic coating

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