Nanosensors PPP-SEIH

As low as $320.00
In stock
SKU
PPP-SEIH -(select options)

Special Tapping Mode AFM Probe

Ordering Information

Quantity

Coating

Part Number

Price
10 
probes
None PPP-SEIH-10
$320.00
Al reflex PPP-SEIHR-10
20 
probes
None PPP-SEIH-20
$573.00
Al reflex PPP-SEIHR-20
50 
probes
None PPP-SEIH-50
$1,265.00
Al reflex PPP-SEIHR-50


The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORS™ PPP-SEIH AFM probes (Seiko Instruments / high force constant).

The probe offers unique features:

  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 5 4.0 - 6.0
Mean Width /µm 33 25 - 40
Length /µm 225 215 - 235
Force Constant /(N/m) 15 5 - 37
Resonance Frequency /kHz 130 96 - 175

More Information
Spring Constant (Nominal) 15 N/m
Spring Constant $15.00
Frequency (Nominal) 130 kHz
Frequency $130.00
Allow Set Quantities Yes
Featured Yes
Specs

Special Tapping Mode AFM Probe

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