Nanosensors PPP-XYCONTR

As low as $320.00
In stock
SKU
PPP-XYCONTR -(select options)

Contact Mode AFM Probe with Special Alignment System

Ordering Information

Quantity

Coating

Part Number

Price
10 
probes
Au Reflex PPP-XYCONTR-10
$320.00
20 
probes
Au Reflex PPP-XYCONTR-20
$573.00
50 
probes
Au Reflex PPP-XYCONTR-50
$1,265.00

The XY-auto-alignment probes for Contact mode application with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 450 µm long cantilevers optimized for contact mode applications. Probe exchange with a tip repositioning accuracy of better than ± 8 µm is possible for all probes of the XY-alignment probes series - independent of their cantilever length. This series is adjusted to the tip position of probes with a cantilever length of 225 µm.

As a matter of course, the features of the proven Point Probe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.

The probe offers unique features:

  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of cantilever
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 2 1.0 - 3.0
Mean Width /µm 50 42.5 - 57.5
Length /µm 450 440 - 460
Force Constant /(N/m) 0.2 0.02 - 0.77
Resonance Frequency /kHz 13 6 - 21
More Information
Spring Constant (Nominal) 0.2 N/m
Spring Constant $0.20
Frequency (Nominal) 13 kHz
Frequency $13.00
Allow Set Quantities Yes
Featured Yes
Specs

Contact Mode AFM Probe with Special Alignment System

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