Nanosensors SSS-FM

As low as $757.00
In stock
SKU
SSS-FM -(select options)

SuperSharp, Force Modulation AFM Probe

Ordering Information

Quantity

Coating

Part Number

Price
10 
probes
None SSS-FM-10
$757.00
Al reflex SSS-FMR-10
25 
probes
None SSS-FM-20
$1,355.00
Al reflex SSS-FMR-20
50 
probes
None SSS-FM-50
$2,988.00
Al reflex SSS-FMR-50

NANOSENSORS™ SSS-FM AFM probes are designed for force modulation mode.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FM tip serves also as a basis for high resolution tips with magnetic coatings (SSS-MFMR). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:

  • guaranteed tip radius of curvature < 5 nm
  • typical tip radius of curvature of 2 nm
  • typical aspect ratio at 200 nm from tip apex in the order of 4:1
  • half cone angle at 200 nm from apex < 10°
  • monolithic material
  • highly doped to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 30 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
More Information
Spring Constant (Nominal) 2.8 N/m
Spring Constant $2.80
Frequency (Nominal) 75 kHz
Frequency $75.00
Allow Set Quantities Yes
Featured Yes
Specs

SuperSharp, Force Modulation AFM Probe

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