Nanosensors SSS-NCL

As low as $757.00
In stock
SSS-NCL -(select options)

SuperSharp, Tapping Mode AFM Probe with Long Cantilever

Ordering Information



Part Number

None SSS-NCL-10
Al reflex SSS-NCLR-10
None SSS-NCL-20
Al reflex SSS-NCLR-20
None SSS-NCL-50
Al reflex SSS-NCLR-50

NANOSENSORS™ SSS-NCL probes are designed for non-contact mode or tapping mode AFM. It is offered as an alternative to the NANOSENSORS™ high frequency non contact type (NCH). The SSS-NCL is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:

  • guaranteed tip radius of curvature < 5 nm
  • typical tip radius of curvature of 2 nm
  • typical aspect ratio at 200 nm from tip apex in the order of 4:1
  • half cone angle at 200 nm from apex < 10°
  • monolithic material
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 7 6.0 - 8.0
Mean Width /µm 38 30 - 45
Length /µm 225 215 - 235
Force Constant /(N/m) 48 21 - 98
Resonance Frequency /kHz 190 146 - 196
More Information
Spring Constant (Nominal) 48 N/m
Spring Constant $48.00
Frequency (Nominal) 190 kHz
Frequency $190.00
Allow Set Quantities Yes
Featured Yes

SuperSharp, Tapping Mode AFM Probe with Long Cantilever

© 2018 Nanoscience Instruments