Nanosensors SSS-SEIH

As low as $757.00
In stock
SSS-SEIH -(select options)

SuperSharp, Special Tapping Mode AFM Probe

Ordering Information



Part Number

None SSS-SEIH-10
Al reflex SSS-SEIHR-10
None SSS-SEIH-20
Al reflex SSS-SEIHR-20
None SSS-SEIH-50
Al reflex SSS-SEIHR-50

For owners of a Seiko Instruments microscope using the non-contact mode we recommend the NANOSENSORS™ SEIH type (Seiko Instruments / high force constant). Compared with the ZEIH type the force constant is further reduced.

For enhanced resolution of nanostructures and microroughness we offer our Super SharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:

  • guaranteed tip radius of curvature < 5 nm
  • typical tip radius of curvature of 2 nm
  • typical aspect ratio at 200 nm from tip apex in the order of 3:1
  • half cone angle at 200 nm from apex < 10°
  • monolithic material
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 5 4.0 - 6.0
Mean Width /µm 33 30 - 45
Length /µm 225 215 - 235
Force Constant /(N/m) 15 5 - 37
Resonance Frequency /kHz 130 96 - 175

More Information
Spring Constant (Nominal) 15 N/m
Spring Constant $15.00
Frequency (Nominal) 130 kHz
Frequency $130.00
Allow Set Quantities Yes
Featured Yes

SuperSharp, Special Tapping Mode AFM Probe

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