(1 of each)
|4 µm and 10 µm||33000||$229.00|
Our 32400 and 32100 calibration standards offer outstanding quality at a very low price and permit calibration of an AFM scanner in all three dimensions. These etched silicon XYZ gratings are easy to use – no alignment or positioning is necessary – because the calibration area covers the entire 5 mm x 5 mm sample area. They feature a chessboard-like structure consisting of either a 2 µm square pattern with a 4 µm period (32400) or a 5 µm square pattern with a 10 µm period (32100). The structure step height is in the range of 25 nm. The grating is glued to a 10mm diameter steel disc with conductive epoxy.
Die size: 5 x 5 mm
Surface geometry: Square silicon mesas with either a 4 µm or 10 µm pitch, arranged over the entire surface area.
Step height: ~ 25 nm