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Aspire – Experience the Conical Advantage™
The geometry of an AFM tip plays an important role when imaging surfaces. The use of a uniform, conical tip guarantees that you’re acquiring truly symmetrical images. A conical shape is especially beneficial when imaging membranes (holes) and pillar structures, or random structures with surface roughness. Aspire™ AFM probes are the first conically-shaped AFM tips for the mass-market. Manufactured from high-quality, highly doped, single crystal silicon, these probes are robust and offer long imaging life.
Aspire probe model CT300 is designed for general tapping mode applications and features a typical tip radius of 8 nm. (A sharper, higher-aspect conical tip is available on Team Nanotec’s SS-ISC probe.) An industry-standard chip design guarantees compatibility with all standard AFM chip holders and also the pre-aligned holders on Nanosurf AFMs. Model CT300R probes have an aluminum Reflex coating on the cantilever’s detector side. The coating improves laser reflection and does not coat the cantilever’s tip.
Please contact us about packaging options for half wafers (200 probes) and full wafers (400 probes).
|Technical Data||Typical Value||Range|
|Force Constant||40 N/m||20 – 95 N/m|
|Resonance Frequency||300 kHz||208 – 392 kHz|
|Length||125 µm||115 – 135 µm|
|Width||42 µm||40 – 45 µm|
|Thickness||3.5 µm||2.5 – 4.5 µm|
|Shape / Cross-section||Rectangular / Rectangular|
|Number of Cantilevers||1 per chip|
|Tip Offset||~ 10 µm|
|Tip Aspect Ratio||1.5:1|
|Tip Cone Angle||30 degrees|
|Tip Height||15 µm||12.5 – 17.5 µm|
|Tip Radius||~ 8 nm||< 10 nm|
|Material||Single Crystal Silicon, n-type, highly doped|
|3400 µm (L) x 1600 µm (W) x 315 µm (T)|
|Coating (optional)||Aluminum reflex (on non-tip side)|