Why Characterize Your AFM Tip?
When imaging a new sample in an AFM, it may be difficult to know whether you have obtained an accurate representation of the surface. Even when a sample has already been well-characterized, an independent means of assessing the influence of the probe tip on the image is desirable.
A broken or misshapen probe tip results in inaccurate rendering of samples. Extra time from an already busy schedule can be consumed in further clarification work that wouldn’t have been needed otherwise. Worse, if the tip damage goes undetected, the true topographical nature of your samples may inadvertently go unnoticed.
Using microscopy techniques such as SEM to look for breakage in tips is neither convenient nor economical enough to be done routinely.
A simple, convenient means to prescreen all of your AFM tips is certainly desirable! You can thereby save time and effort, and avoid frustration. Fortunately, there is a simple and effective means to prescreen your tips, and assess used tips as well.
TipCheck exploits reverse imaging to provide a fast and simple way to assess new and used tips without the need for SEM inspection.
The microstructure of the TipCheck film is ideal for the detection of tip morphology in the vicinity of the tip apex.
The film is supplied on a chip of silicon, ready to be placed in your AFM. Instructions are provided with examples of images to aid you in getting started with your own sample library.
A Complete Solution
By combining the TipCheck sample and SPIP software, you have a turn-key solution to properly analyzing your AFM data.